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$X-Ray Diffraction Investigation of Si Crystals with Randomly Distributed Microdefects by the Inclination Method$

X-Ray Diffraction Investigation of Si Crystals with Randomly Distributed Microdefects by the Inclination Method

S. N. Voronkov; F. N. Chukhovskii; P. V. Lomovtsev; S. P. Darbinyan

作者S. N. Voronkov; F. N. Chukhovskii; P. V. Lomovtsev; S. P. Darbinyan
卷第134卷
期第2期
印刷ISSN1862-6319
文件大小800.05KB
发表时间1992
DOI10.1002/pssa.2211340202
页码301-316

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