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SPIE Proceedings [SPIE SPIE's 1992 Symposium on Process Control and Monitoring - Somerset, NJ (Sunday 22 March 1992)] Optically Based Methods for Process Analysis - <title>Time-resolved fluorescence analysis</title>

SPIE Proceedings [SPIE SPIE's 1992 Symposium on Process Control and Monitoring - Somerset, NJ (Sunday 22 March 1992)] Optically Based Methods for Process Analysis - Time-resolved fluorescence analysis

Ross, J. B. Alexander; Laws, William R.; Bomse, David S.; Brittain, Harry; Farquharson, Stuart; Lerner, Jeremy M.; Rein, Alan J.; Sohl, Cary; Todd, Terry R.; Weyer, Lois
  • 作者Ross, J. B. Alexander; Laws, William R.; Bomse, David S.; Brittain, Harry; Farquharson, Stuart; Lerner, Jeremy M.; Rein, Alan J.; Sohl, Cary; Todd, Terry R.; Weyer, Lois
  • 卷第1681卷
  • 印刷ISSN0277-786X
  • 文件大小742.70KB
  • 发表时间1992
  • DOI10.1117/12.137726
  • 页码98-105
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