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Investigation of techniques for minimizing resistivity of thin metallic films at submillimeter wavelengths

Investigation of techniques for minimizing resistivity of thin metallic films at submillimeter wavelengths

K. S. Schieuer; J. M. Baird; L. R. Barnett; R. W. Grow
  • 作者K. S. Schieuer; J. M. Baird; L. R. Barnett; R. W. Grow
  • 卷第13卷
  • 期第8期
  • 印刷ISSN0195-9271
  • 电子ISSN1572-9559
  • 文件大小191.61KB
  • 发表时间1992-08
  • DOI10.1007/bf01009056
  • 页码1139-1143
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