Encyclopedia of Materials Characterization || Surface Roughness
- 作者STEVIE, FRED A.
- 文件大小1289.28KB
- 发表时间1992
- DOI10.1016/b978-0-08-052360-6.50066-7
- 页码698-710
XPS analysis of FIB-milled SiAmy C. Ferryman; Julia E. Fulghum; Lucille A. Giannuzzi; Fred A. Stevie · 2002
PrefaceJerry Hunter; Bruno W. Schueler; Fred A. Stevie · 2004
Introduction to Focused Ion Beams ||Giannuzzi, Lucille A.; Stevie, Fred A. · 2005
Introduction to Focused Ion Beams || Ion - Solid InteractionsGiannuzzi, Lucille A.; Stevie, Fred A. · 2005
Multiple Analytical Instrumentation for Complete Materials CharacterizationSchwarz, Stephen M.; Kempshall, Brian W.; Giannuzzi, Lucille A.; Stevie, Fred A. · Microscopy and Microanalysis · 2003
Introduction to Focused Ion Beams || Device Edits and ModificationsGiannuzzi, Lucille A.; Stevie, Fred A. · 2005
Introduction to Focused Ion Beams || The Focused Ion Beam InstrumentGiannuzzi, Lucille A.; Stevie, Fred A. · 2005