Transport and recombination in a-Si:H p-i-n diodes under forward bias conditions
R. Carius; F. Becker; R. Brüggemann; F. Finger; C. Beneking; H. Wagner
- 作者R. Carius; F. Becker; R. Brüggemann; F. Finger; C. Beneking; H. Wagner
- 印刷ISSN0022-3093
- 文件大小340.02KB
- 发表时间1993
- DOI10.1016/0022-3093(93)90611-z