Semiconductor Growth, Surfaces and Interfaces || Probing Semiconductor Interfaces by Transmission Electron Microscopy
- 期刊名称Philosophical Transactions: Physical Sciences and Engineering
- 作者J. W. Steeds and D. Cherns
- 卷第344卷
- 期第1673期
- 印刷ISSN0962-8428
- 文件大小1950.91KB
- 发表时间1993-09-15
- DOI10.2307/54122
- 页码545-556
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