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RbBr/Si(111) interface studied by the X-ray standing wave method

RbBr/Si(111) interface studied by the X-ray standing wave method

V. Eteläniemi; E.G. Michel; G. Materlik
  • 作者V. Eteläniemi; E.G. Michel; G. Materlik
  • 印刷ISSN0167-2584
  • 文件大小60.56KB
  • 发表时间1993
  • DOI10.1016/0167-2584(93)90437-n
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