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Single-electron tunneling in double-barrier junctions by scanning tunneling microscopy

Single-electron tunneling in double-barrier junctions by scanning tunneling microscopy

C. Schönenberger; H. van Houten; J.M. Kerkhof; H.C. Donkersloot

作者C. Schönenberger; H. van Houten; J.M. Kerkhof; H.C. Donkersloot
卷第67卷
印刷ISSN0169-4332
文件大小425.22KB
发表时间1993
DOI10.1016/0169-4332(93)90316-4
页码222-227

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