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[IEEE Comput. Soc. Press 1993 IEEE 2nd Asian Test Symposium (ATS) - Beijing, China (16-18 Nov. 1993)] Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) - Reliable fail-safe systems

[IEEE Comput. Soc. Press 1993 IEEE 2nd Asian Test Symposium (ATS) - Beijing, China (16-18 Nov. 1993)] Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) - Reliable fail-safe systems

Lubaszewski, M.; Courtois, B.

作者Lubaszewski, M.; Courtois, B.
文件大小717.26KB
发表时间1993
DOI10.1109/ATS.1993.398775
页码32-37

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