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[IEEE 1993 IEEE International Frequency Control Symposium - Salt Lake City, UT, USA (2-4 June 1993)] 1993 IEEE International Frequency Control Symposium - X ray topography study of gallium phosphate crystals and resonators

Capelle, B.; Zarka, A.; Schwartzel, J.; Detaint, J.; Zheng, Y.; Ibanez, A.; Philippot, E.

作者Capelle, B.; Zarka, A.; Schwartzel, J.; Detaint, J.; Zheng, Y.; Ibanez, A.; Philippot, E.
文件大小659.35KB
发表时间1993
DOI10.1109/FREQ.1993.367481
页码813-820