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[IEEE AUTOTESTCON 93 - San Antonio, TX, USA (20-23 Sept. 1993)] AUTOTESTCON 93 - Reconstruction of trace map of a circuit card assembly based on fuzzy pattern recognition

[IEEE AUTOTESTCON 93 - San Antonio, TX, USA (20-23 Sept. 1993)] AUTOTESTCON 93 - Reconstruction of trace map of a circuit card assembly based on fuzzy pattern recognition

Zhou, J.; Longbotham, H.
  • 作者Zhou, J.; Longbotham, H.
  • 文件大小630.09KB
  • 发表时间1993
  • DOI10.1109/AUTEST.1993.396354
  • 页码157-163
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