[IEEE 42nd ARFTG Conference Digest - San Jose, CA, USA (1993.12.2-1993.12.3)] 42nd ARFTG Conference Digest - A Pulse Bias/RF Environment for Device Characterization
- 作者Taylor, Barry; Sayed, Mohamed; Kerwin, Kevin
- 文件大小264.71KB
- 发表时间1993
- DOI10.1109/arftg.1993.327043
- 页码57-60
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