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Excitation efficiency in thin-film electroluminescent devices: Probe layer measurements

Excitation efficiency in thin-film electroluminescent devices: Probe layer measurements

J. Benoit; C. Barthou; P. Benalloul
  • 作者J. Benoit; C. Barthou; P. Benalloul
  • 文件大小1205.08KB
  • 发表时间1993
  • DOI10.1063/1.353242
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