[IEEE 1993 (5th) International Conference on Indium Phosphide and Related Materials - Paris, France (19-22 April 1993)] 1993 (5th) International Conference on Indium Phosphide and Related Materials - Experimental characterization of interface roughness in strained InGaAs/InP MQWs after a growth interruption sequence

Juillaguet, S.; Schwedler, R.; Kohl, A.; Baumann, F.H.; Fraisse, B.; Camassel, J.; Wolter, K.; Leo, K.; Gallmann, B.; Stollenwerck, M.; Laurenti, J.P.

作者Juillaguet, S.; Schwedler, R.; Kohl, A.; Baumann, F.H.; Fraisse, B.; Camassel, J.; Wolter, K.; Leo, K.; Gallmann, B.; Stollenwerck, M.; Laurenti, J.P.
文件大小328.46KB
发表时间1993
DOI10.1109/iciprm.1993.380650
页码301-304

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