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SPIE Proceedings [SPIE Measurement Technology and Intelligent Instruments - Wuhan, China (Friday 29 October 1993)] Measurement Technology and Intelligent Instruments - <title>Grating technology for topography measurement of curved surfaces</title>

SPIE Proceedings [SPIE Measurement Technology and Intelligent Instruments - Wuhan, China (Friday 29 October 1993)] Measurement Technology and Intelligent Instruments - Grating technology for topography measurement of curved surfaces

Jiang, Xiangqian; Xie, Tie-Bang; Yao, Cai-Xian; Li, Zhu; Zhu, Li
  • 作者Jiang, Xiangqian; Xie, Tie-Bang; Yao, Cai-Xian; Li, Zhu; Zhu, Li
  • 卷第2101卷
  • 印刷ISSN0277-786X
  • 文件大小235.36KB
  • 发表时间1993
  • DOI10.1117/12.156502
  • 页码554-557
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