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SPIE Proceedings [SPIE Photoelectronic Detection and Imaging: Technology and Applications '93 - Beijing, China (Monday 17 May 1993)] Photoelectronic Detection and Imaging: Technology and Applications '93 - <title>Adjacent-event detection in intensified CCDs using a Hopfield neural network</title>

SPIE Proceedings [SPIE Photoelectronic Detection and Imaging: Technology and Applications '93 - Beijing, China (Monday 17 May 1993)] Photoelectronic Detection and Imaging: Technology and Applications '93 - Adjacent-event detection in intensified CCDs using a Hopfield neural network

Prud'homme, Tony; Zhou, LiWei
  • 作者Prud'homme, Tony; Zhou, LiWei
  • 卷第1982卷
  • 印刷ISSN0277-786X
  • 文件大小368.83KB
  • 发表时间1993
  • DOI10.1117/12.142050
  • 页码394-403
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