$SPIE Proceedings [SPIE Measurement Technology and Intelligent Instruments - Wuhan, China (Friday 29 October 1993)] Measurement Technology and Intelligent Instruments - <title>Dimension-measurement-based laser diffraction</title>$

SPIE Proceedings [SPIE Measurement Technology and Intelligent Instruments - Wuhan, China (Friday 29 October 1993)] Measurement Technology and Intelligent Instruments - Dimension-measurement-based laser diffraction

Yilmaz, Mustafa; Ozcalik, H. R.; Zhu, Li

作者Yilmaz, Mustafa; Ozcalik, H. R.; Zhu, Li
卷第2101卷
印刷ISSN0277-786X
文件大小197.48KB
发表时间1993
DOI10.1117/12.156471
页码403-408

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SPIE Proceedings [SPIE Measurement Technology and Intelligent Instruments - Wuhan, China (Friday 29 October 1993)] Measurement Technology and Intelligent Instruments - Dimension-measurement-based laser diffraction