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Ability of secondary-ion mass spectrometry to study the growth mode of a deposit on a substrate: Case of cobalt deposition on (100) copper surfaces

Ability of secondary-ion mass spectrometry to study the growth mode of a deposit on a substrate: Case of cobalt deposition on (100) copper surfaces

S. Bourgeois; O. Heintz; F. Jomard; M. Perdereau

作者S. Bourgeois; O. Heintz; F. Jomard; M. Perdereau
卷第226卷
期第1期
印刷ISSN0040-6090
文件大小345.79KB
发表时间1993
DOI10.1016/0040-6090(93)90202-z
页码35-38

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