Cyclic fatigue crack growth from indentation flaw in silicon nitride: Influence of effective stress ratio
- 作者Choi, Guen; Horibe, Susumu; Kawabe, Yoshikuni
- 卷第42卷
- 期第11期
- 文件大小469.70KB
- 发表时间1994
- DOI10.1016/0956-7151(94)90449-9
- 页码3837-3842
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