Extended Spectral Analysis of Multiple Beam Interferometry: A Technique To Study Metallic Films in the Surface Forces Apparatus
Levins, John M.; Vanderlick, T. Kyle
- 期刊名称Langmuir
- 作者Levins, John M.; Vanderlick, T. Kyle
- 卷第10卷
- 期第7期
- 印刷ISSN0743-7463
- 电子ISSN1520-5827
- 文件大小1898.22KB
- 发表时间1994-07
- DOI10.1021/la00019a059
- 页码2389-2394