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[IEEE 43rd ARFTG Conference Digest - San Diego, CA, USA (1994.05.27-1994.05.27)] 43rd ARFTG Conference Digest - Network Analyzer Calibration for Cryogenic On-Wafer Measurements

[IEEE 43rd ARFTG Conference Digest - San Diego, CA, USA (1994.05.27-1994.05.27)] 43rd ARFTG Conference Digest - Network Analyzer Calibration for Cryogenic On-Wafer Measurements

Hietala, Vincent M.; Housel, Mark S.; Caldwell, Robert B.

作者Hietala, Vincent M.; Housel, Mark S.; Caldwell, Robert B.
文件大小1102.19KB
发表时间1994
DOI10.1109/arftg.1994.327055
页码24-33

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