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[IEEE Comput. Soc. Press IEEE 3rd Asian Test Symposium (ATS) - Nara, Japan (15-17 Nov. 1994)] Proceedings of IEEE 3rd Asian Test Symposium (ATS) - A partial scan algorithm based on reduced scan shift

[IEEE Comput. Soc. Press IEEE 3rd Asian Test Symposium (ATS) - Nara, Japan (15-17 Nov. 1994)] Proceedings of IEEE 3rd Asian Test Symposium (ATS) - A partial scan algorithm based on reduced scan shift

Higami, Y.; Kajihara, S.; Kinoshita, K.

作者Higami, Y.; Kajihara, S.; Kinoshita, K.
文件大小545.14KB
发表时间1994
DOI10.1109/ats.1994.367209
页码336-341

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