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Transmission electron microscopy and high-resolution electron microscopy studies of structural defects induced in 6H α-SiC single crystals irradiated by swift Xe ions

Transmission electron microscopy and high-resolution electron microscopy studies of structural defects induced in 6H α-SiC single crystals irradiated by swift Xe ions

Lhermitte-sebire, I.; Vicens, J.; Chermant, J. L.; Levaloi, M.; Paumier, E.

期刊名称Philosophical Magazine A
作者Lhermitte-sebire, I.; Vicens, J.; Chermant, J. L.; Levaloi, M.; Paumier, E.
卷第69卷
期第2期
印刷ISSN0141-8610
电子ISSN1460-6992
文件大小3724.79KB
发表时间1994-02
DOI10.1080/01418619408244341
页码237-253

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