发现好书期刊,享受阅读乐趣

海量图书期刊资源,随时随地畅享阅读乐趣

SPIE Proceedings [SPIE Microelectronic Processing '93 - Monterey, CA (Sunday 26 September 1993)] Microelectronic Processes, Sensors, and Controls - <title>Charge-buildup damage to gate oxide</title>

SPIE Proceedings [SPIE Microelectronic Processing '93 - Monterey, CA (Sunday 26 September 1993)] Microelectronic Processes, Sensors, and Controls - Charge-buildup damage to gate oxide

Gabriel, Calvin; Bondur, James A.; Elliott, Kiefer; Hauser, John R.; Kwong, Dim-Lee; Ray, Asit K.
  • 作者Gabriel, Calvin; Bondur, James A.; Elliott, Kiefer; Hauser, John R.; Kwong, Dim-Lee; Ray, Asit K.
  • 卷第2091卷
  • 印刷ISSN0277-786X
  • 文件大小218.98KB
  • 发表时间1994
  • DOI10.1117/12.167344
  • 页码239-247
← 返回【学霸图书馆】主页