SPIE Proceedings [SPIE Optoelectronic Science and Engineering '94: International Conference - Beijing, China (Monday 15 August 1994)] Second International Conference on Optoelectronic Science and Engineering '94 - New principle for colormetric measurements
- 作者Chen, Zhongmou; Qian, Haihong; Da-Heng, Wang; Consortini, Anna; Breckinridge, James B.
- 卷第2321卷
- 印刷ISSN0277-786X
- 文件大小104.26KB
- 发表时间1994
- DOI10.1117/12.182000
- 页码24-26
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