Optimal Testing and Design of Adders
- 期刊名称VLSI Design
- 作者Batek, Michael J.; Hayes, John P.
- 卷第1卷
- 期第4期
- 印刷ISSN1065-514X
- 电子ISSN1563-5171
- 文件大小2950.31KB
- 发表时间1994
- DOI10.1155/1994/74269
- 页码285-298
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