The role of interface impurities in Co/Cu giant magnetoresistance multilayers
K.P. Wellock; B.J. Hickey; J. Xu; M.J. Walker; N. Wiser
- 作者K.P. Wellock; B.J. Hickey; J. Xu; M.J. Walker; N. Wiser
- 印刷ISSN0304-8853
- 文件大小228.27KB
- 发表时间1995
- DOI10.1016/0304-8853(94)01040-4
- 页码585-586