Crystalline quality and residual stresses in diamond layers by Raman and x-ray diffraction analyses
- 期刊名称Journal of Applied Physics
- 作者Rats, D.; Bimbault, L.; Vandenbulcke, L.; Herbin, R.; Badawi, K. F.
- 卷第78卷
- 期第8期
- 印刷ISSN0021-8979
- 文件大小1165.43KB
- 发表时间1995
- DOI10.1063/1.359725
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