[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - VMESS: VLSI mechanical stress simulator
Bhattacharyya, A.B.; Singh, D.N.; Metha, R.; Goswami, I.
- 作者Bhattacharyya, A.B.; Singh, D.N.; Metha, R.; Goswami, I.
- 文件大小361.93KB
- 发表时间1995
- DOI10.1109/IPFA.1995.487623
- 页码200-205