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[IEEE Comput. Soc. Press the European Design and Test Conference. ED&TC 1995 - Paris, France (6-9 March 1995)] Proceedings the European Design and Test Conference. ED&TC 1995 - Accumulator-based BIST approach for stuck-open and delay fault testing

[IEEE Comput. Soc. Press the European Design and Test Conference. ED&TC 1995 - Paris, France (6-9 March 1995)] Proceedings the European Design and Test Conference. ED&TC 1995 - Accumulator-based BIST approach for stuck-open and delay fault testing

Voyiatzis, I.; Paschalis, A.; Nikolos, D.; Halatsis, C.

作者Voyiatzis, I.; Paschalis, A.; Nikolos, D.; Halatsis, C.
文件大小461.61KB
发表时间1995
DOI10.1109/EDTC.1995.470360
页码431-435

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