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[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - CMOS ESD protection structures-characteristics and performance comparison

[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - CMOS ESD protection structures-characteristics and performance comparison

Fried, R.; Blecher, Y.; Friedman, S.

作者Fried, R.; Blecher, Y.; Friedman, S.
文件大小350.49KB
发表时间1995
DOI10.1109/ipfa.1995.487605
页码106-110

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