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[IEEE Conference Record AUTOTESTCON '95. 'Systems Readiness: Test Technology for the 21st Century' - Atlanta, GA, USA (8-10 Aug. 1995)] Conference Record AUTOTESTCON '95. 'Systems Readiness: Test Technology for the 21st Century' - Automated functional test generation

[IEEE Conference Record AUTOTESTCON '95. 'Systems Readiness: Test Technology for the 21st Century' - Atlanta, GA, USA (8-10 Aug. 1995)] Conference Record AUTOTESTCON '95. 'Systems Readiness: Test Technology for the 21st Century' - Automated functional test generation

Apfelbaum, L.

作者Apfelbaum, L.
文件大小647.26KB
发表时间1995
DOI10.1109/autest.1995.522660
页码101-107

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