[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - IGBT power semiconductor reliability analysis for traction application
- 作者Jacob, P.; Held, M.; Scacco, P.
- 文件大小731.77KB
- 发表时间1995
- DOI10.1109/ipfa.1995.487618
- 页码169-175
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