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[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Fault isolation on mixed signal device

[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Fault isolation on mixed signal device

Tan, K.T.; Ong, S.H.; Yong, C.T.

作者Tan, K.T.; Ong, S.H.; Yong, C.T.
文件大小1446.17KB
发表时间1995
DOI10.1109/ipfa.1995.487598
页码69-74

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