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[IEEE 1995 International Semiconductor Conference. CAS '95 - Sinaia, Romania (11-14 Oct. 1995)] 1995 International Semiconductor Conference. CAS '95 Proceedings - Electrical characterization of porous silicon

[IEEE 1995 International Semiconductor Conference. CAS '95 - Sinaia, Romania (11-14 Oct. 1995)] 1995 International Semiconductor Conference. CAS '95 Proceedings - Electrical characterization of porous silicon

Angelescu, A.; Kleps, I.

作者Angelescu, A.; Kleps, I.
文件大小403.22KB
发表时间1995
DOI10.1109/SMICND.1995.495031
页码335-338

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