[IEEE Conference Record AUTOTESTCON '95. 'Systems Readiness: Test Technology for the 21st Century' - Atlanta, GA, USA (8-10 Aug. 1995)] Conference Record AUTOTESTCON '95. 'Systems Readiness: Test Technology for the 21st Century' - C and C/ATLAS: the logical solution for the future
- 作者Pestana, P.A.
- 文件大小395.55KB
- 发表时间1995
- DOI10.1109/autest.1995.522689
- 页码315-320
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