Structural characterization of stepped Ga/Si(112) surfaces
- 期刊名称Physical Review B
- 作者Yater, J. E.; Shih, A.; Idzerda, Y. U.
- 卷第51卷
- 期第11期
- 印刷ISSN0163-1829
- 电子ISSN1095-3795
- 文件大小285.17KB
- 发表时间1995-3-15
- DOI10.1103/PhysRevB.51.7365
- 页码7365-7368
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