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Multibeamlet focusing of intense negative ion beams by an aperture displacement technique

Multibeamlet focusing of intense negative ion beams by an aperture displacement technique

Y. Takeiri; O. Kaneko; Y. Oka; K. Tsumori; E. Asano; R. Akiyama; T. Kawamoto; T. Kuroda; A. Ando
  • 作者Y. Takeiri; O. Kaneko; Y. Oka; K. Tsumori; E. Asano; R. Akiyama; T. Kawamoto; T. Kuroda; A. Ando
  • 文件大小1191.94KB
  • 发表时间1995
  • DOI10.1063/1.1146091
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