[IEE IEE Colloquium on Methods of Materials Measurement in Microengineering - London, UK (30 Nov. 1995)] IEE Colloquium on Methods of Materials Measurement in Microengineering - Characterisation of micron scale piezomagnetic materials in devices
- 作者Gibbs, M.R.J.
- 卷第1995卷
- 文件大小242.55KB
- 发表时间1995
- DOI10.1049/ic:19951470
- 页码8-8
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Very deep scattering layerJohnson, R. K. · The Journal of the Acoustical Society of America · 1973
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