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[Int. Test Conference 1995 IEEE International Test Conference (ITC) - Washington, DC, USA (21-25 Oct. 1995)] Proceedings of 1995 IEEE International Test Conference (ITC) - Improved boundary scan design

[Int. Test Conference 1995 IEEE International Test Conference (ITC) - Washington, DC, USA (21-25 Oct. 1995)] Proceedings of 1995 IEEE International Test Conference (ITC) - Improved boundary scan design

Whetsel, L.

作者Whetsel, L.
文件大小1006.65KB
发表时间1995
DOI10.1109/test.1995.529917
页码851-860

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