[IEEE 1995 Proceedings. 45th Electronic Components and Technology Conference - Las Vegas, NV, USA (21-24 May 1995)] 1995 Proceedings. 45th Electronic Components and Technology Conference - Crack initiation and growth in electronic packages
- 作者Ileri, L.; Madenci, E.
- 文件大小533.04KB
- 发表时间1995
- DOI10.1109/ectc.1995.517808
- 页码970-976
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