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[Int. Test Conference 1995 IEEE International Test Conference (ITC) - Washington, DC, USA (21-25 Oct. 1995)] Proceedings of 1995 IEEE International Test Conference (ITC) - Integrated test solutions and test economics for MCMs

[Int. Test Conference 1995 IEEE International Test Conference (ITC) - Washington, DC, USA (21-25 Oct. 1995)] Proceedings of 1995 IEEE International Test Conference (ITC) - Integrated test solutions and test economics for MCMs

Kornegay, K.T.; Roy, K.

作者Kornegay, K.T.; Roy, K.
文件大小807.07KB
发表时间1995
DOI10.1109/test.1995.529833
页码193-201

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