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SPIE Proceedings [SPIE International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Kiev, Ukraine (Thursday 11 May 1995)] International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - <title>Optical absorption and thermal expansion of semiconductor glasses As-S-Ge by topological transition</title>

SPIE Proceedings [SPIE International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Kiev, Ukraine (Thursday 11 May 1995)] International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Optical absorption and thermal expansion of semiconductor glasses As-S-Ge by topological transition

Tsiulyanu, D.; Gumenyuk, N.; Marian, S.; Svechnikov, Sergey V.; Valakh, Mikhail Y.
  • 作者Tsiulyanu, D.; Gumenyuk, N.; Marian, S.; Svechnikov, Sergey V.; Valakh, Mikhail Y.
  • 卷第2648卷
  • 印刷ISSN0277-786X
  • 文件大小232.51KB
  • 发表时间1995
  • DOI10.1117/12.226198
  • 页码41-47
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