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[IEEE Comput. Soc. Press 1995 INRIA/IEEE Symposium on Emerging Technologies and Factory Automation. ETFA'95 - Paris, France (10-13 Oct. 1995)] Proceedings 1995 INRIA/IEEE Symposium on Emerging Technologies and Factory Automation. ETFA'95 - Evaluation criteria: a method to represent and compute technological knowledge in CAPP

[IEEE Comput. Soc. Press 1995 INRIA/IEEE Symposium on Emerging Technologies and Factory Automation. ETFA'95 - Paris, France (10-13 Oct. 1995)] Proceedings 1995 INRIA/IEEE Symposium on Emerging Technologies and Factory Automation. ETFA'95 - Evaluation criteria: a method to represent and compute technological knowledge in CAPP

Mognol, P.; Anselmetti, B.

作者Mognol, P.; Anselmetti, B.
卷第2卷
文件大小523.52KB
发表时间1995
DOI10.1109/etfa.1995.496682
页码419-426

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