SPIE Proceedings [SPIE SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 9 July 1995)] X-Ray and Extreme Ultraviolet Optics - Alignment test system for AXAF-I's high-resolution mirror assembly
- 作者Waldman, Mark; Hoover, Richard B.; Walker, Jr., Arthur B. C.
- 卷第2515卷
- 印刷ISSN0277-786X
- 文件大小548.23KB
- 发表时间1995
- DOI10.1117/12.212610
- 页码330-339
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