Environmental SEMs: A New Way to Look at Samples
Chernoff, Don; Mujallid, Mohammad Salim
- 期刊名称Microscopy Today
- 作者Chernoff, Don; Mujallid, Mohammad Salim
- 卷第3卷
- 期第8期
- 印刷ISSN1551-9295
- 电子ISSN2150-3583
- 文件大小3935.14KB
- 发表时间1995-10
- DOI10.1017/S155192950006291X
- 页码14-15