OO testing in the real world (panel)
McGregor, John D.; Berard, Ed; Firesmith, Don; Marick, Brian; Thomson, Dave
- 期刊名称ACM SIGPLAN Notices
- 作者McGregor, John D.; Berard, Ed; Firesmith, Don; Marick, Brian; Thomson, Dave
- 卷第30卷
- 期第10期
- 印刷ISSN0362-1340
- 文件大小23.93KB
- 发表时间1995-10-17
- DOI10.1145/217839.217850