Controlled-Humidity XRD Analyses: Application to the Study of Smectite Expansion/Contraction

• 期刊名称Advances in X-ray Analysis
• 作者Chipera, Steve J.; Carey, J. William; Bish, David. L.
• 卷第39卷
• 印刷ISSN0376-0308
• 电子ISSN2631-3626
• 文件大小494.42KB
• 发表时间1995
• DOI10.1154/S0376030800023168
• 页码713-722