![AIP Conference Proceedings [AIP APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY: Twenty-First International Conference - Fort Worth, Texas, (USA) (8–13 August 2010)] - Positron Annihilation Induced Auger Electron Spectroscopic Studies Of Reconstructed Semiconductor Surfaces]()
AIP Conference Proceedings [AIP APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY: Twenty-First International Conference - Fort Worth, Texas, (USA) (8–13 August 2010)] - Positron Annihilation Induced Auger Electron Spectroscopic Studies Of Reconstructed Semiconductor SurfacesFazleev, N. G.; Reed, J. A.; Starnes, S. G.; Weiss, A. H.; McDaniel, Floyd D.; Doyle, Barney L. · 2011