In-situ spectroscopic ellipsometry of HgCdTe
- 作者J. D. Benson; A. B. Cornfeld; M. Martinka; K. M. Singley; Z. Derzko; P. J. Shorten; J. H. Dinan; P. R. Boyd; F. C. Wolfgram; B. Johs; P. He; John A. Woollam
- 卷第25卷
- 期第8期
- 印刷ISSN0361-5235
- 电子ISSN1543-186X
- 文件大小614.77KB
- 发表时间1996-08
- DOI10.1007/bf02655042
- 页码1406-1410
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